Volume 16, Number 2 (2025)

CONTENTS

Interface Trap Effects and Reliability of Metal-Oxide-Semiconductor Devices
Omar Al-Khatib and Dalia Mansour

 

Semiconductor Materials for Next-Generation Infrared Photodetectors
Fahad Al-Rashid and Nour Haddad

 

Device Modeling and Simulation of Advanced CMOS Semiconductor Structures
Min-jun Park and Seo-yeon Choi

 

Defect Engineering in Wide-Bandgap Semiconductors for Electronic Applications
Wei Zhang and Lin Yue

 

Thin-Film Deposition and Materials Processing for Compound Semiconductor Devices
João Carvalho and Mariana Teixeira

 

Numerical Modeling of Charge Transport in Semiconductor Heterojunction Devices
Diego Herrera and Valentina Rojas

 

Nanostructured Semiconductor Devices for Emerging Optoelectronic Applications
Lorenzo Bianchi and Chiara Ferraro

 

Thermal Management and Reliability of High-Power Semiconductor Devices
Stefan Novak and Katarina Horvat

 

Advanced Semiconductor Materials for Flexible and Wearable Electronics
Devendra Shetty and Mitali Deshpande